Advertisement

High brillance X-ray sources

  • M. Yoshimatsu
  • S. Kozaki
Chapter
Part of the Topics in Applied Physics book series (TAP, volume 22)

Keywords

Target Surface Rotary Shaft Circumferential Velocity Allowable Load Unit Solid Angle 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 2.1
    W. Ehrenberg, W. R. Spear: Proc. Phys. Soc. (London) B64, 67 (1951)Google Scholar
  2. 2.2
    Breton: La revue scient. et industr. de lárnée (1898/99)Google Scholar
  3. 2.3
    A. Bouwers: Physica 10, 125 (1930)Google Scholar
  4. 2.4
    H.Stintzing: Metallwirtschaft 17, 761 (1938); 20, 45 (1941)Google Scholar
  5. 2.5
    J. W. M.DuMond, J.P. Youtz: Rev. Sci. Instr. 8, 291 (1937)CrossRefGoogle Scholar
  6. 2.6
    R. Hosemann: Z. Tech. Phys. 20, 203 (1939)Google Scholar
  7. 2.7
    E. Edamoto: X-sen 3, 5 (1942) (in Japanese)Google Scholar
  8. 2.8
    W.T.Astbury, I. MacArthur: Nature 155, 108 (1945)Google Scholar
  9. 2.9
    H. Stintzing: Z. Phys. 27, 844 (1926)Google Scholar
  10. 2.10
    A. Müller: Proc. Roy. Soc. 125, 507 (1929)Google Scholar
  11. 2.11
    G. Fournier, J. Mathieu: J.Phys. 8, 177 (1937)Google Scholar
  12. 2.12
    R. E. Clay: Proc. Phys. Soc. (London) 46, 703 (1934)CrossRefGoogle Scholar
  13. 2.13
    R. E. Clay, A. Müller: J. Instr. Elect. Engs. 84, 261 (1939)Google Scholar
  14. 2.14
    W. T. Astbury, R. D. Preston: Nature 24, 460 (1934)Google Scholar
  15. 2.15
    Z.Nishiyama: J. Japan Met. Soc. 15, 42 (1940) (in Japanese)Google Scholar
  16. 2.16
    V.Linnitzki, V.Gorski: Sov. Phys.-Tech. Phys. 3, 220 (1936)Google Scholar
  17. 2.17
    R. R. Wilson: Rev. Sci. Instr. 12, 91 (1941)CrossRefGoogle Scholar
  18. 2.18
    S. Miyake, S. Hoshino: X-sen 8, 45 (1954) (in Japanese)Google Scholar
  19. 2.19
    Y. Yoneda, K. Kohra, T. Futagami, M. Koga: Kyushu Univ. Engs. Dept. Rep. 27, 87 (1954)Google Scholar
  20. 2.20
    S. Kiyono, M. Kanayama, T. Konno, N. Nagashita: Technol. Rep., Tohoku Univ. XXVII, 103 (1936)Google Scholar
  21. 2.21
    A.Taylor: J. Sci. Instr. 26, 225 (1949); Rev. Sci. Instr. 27, 757 (1956)CrossRefGoogle Scholar
  22. 2.22
    D. A. Davies: Rev. Sci. Instr. 30, 488 (1959)CrossRefGoogle Scholar
  23. 2.23
    P.Gay, P.B.Hirsh, J.S.Thorp, J.N.Keller: Proc. Phys. Soc. (London) B64, 374 (1951)Google Scholar
  24. 2.24
    A.Müller: Proc. Roy. Soc. 117, 31 (1927)Google Scholar
  25. 2.25
    A.Müller: Proc. Roy. Soc. 132, 646 (1931)Google Scholar
  26. 2.26
    V. E.Cosslett, W. C.Nixon: X-Ray Microscopy (Cambridge Univ. Press, London 1960) pp. 220Google Scholar
  27. 2.27
    W. W. Dolan, W. P. Dyke: Phys. Rev. 95, 327 (1954)CrossRefGoogle Scholar
  28. 2.28
    A. N. Broers: Appl. Phys. 38, 1991, 3040 (1967)CrossRefGoogle Scholar
  29. 2.29
    A.Müller: Nature 27, 128 (1929)Google Scholar
  30. 2.30
    J. M. W. DuMond, B. B. Watson, B. Hicks: Rev. Sci. Instr. 6, 183 (1935)CrossRefGoogle Scholar
  31. 2.31
    T. Ishimura, Y.Shiraiwa, M.Sawada: J. Phys. Soc. Japan 12, 1064 (1957)Google Scholar
  32. 2.32
    J.Chikawa: Oyo Butsuri 43, 230 (1974) (in Japanese)Google Scholar
  33. 2.33
    W.J.Oosterkamp: Phil. Res. Rep. 3, 49, 161, 303 (1948)Google Scholar
  34. 2.34
    T.Sato: Tech. Memo. Oosaka Tech. Univ. 2, 77 (1956) (in Japanese)Google Scholar
  35. 2.35
    J. Chikawa I. Fujimoto: NHK Tech. Monograph 23 (1974)Google Scholar
  36. 2.36
    M. Green: X-Ray Optics and X-Ray Microanalysis (Academic Press, New York, London 1963) Pp. 185Google Scholar
  37. 2.37
    A.Guinier: Théorie et Technique de la Radiocristallographie (Dunod, Paris 1964)Google Scholar
  38. 2.38
    A. H. G. Kuntke: Phil. Tech. Rev. 20, 291 (1958/59)Google Scholar
  39. 2.39
    Y.Shimura, M.Yoshimatsu, H.Uematsu: 8th International Congress of Crystallography, Collected Abstracts VIII-12 (1969)Google Scholar
  40. 2.40
    J. R. Pierce: Theory and Design of Electron Beam, 2nd ed. (D. Van Nostrand, London 1954)Google Scholar
  41. 2.41
    D. G. Archard: J. Appl. Phys. 32, 1505 (1961)CrossRefGoogle Scholar
  42. 2.42
    K. Siegbahn, C. Nordling, G.Johanson, J. Hedman: ESCA Applied to Free Molecules (North-Holland, Amsterdam 1969)Google Scholar
  43. 2.42a
    U. Gelius, E. Basilier, S. Svensson, T. Bergmark, K. Siegbahn:UUIP-817, Uppsala Univ., Institute of Physics (1973)Google Scholar
  44. 2.43
    J. Chikawa: Appl. Phys. Letters 13, 387 (1968)CrossRefGoogle Scholar
  45. 2.44
    S. Kozaki, S. Imai, M. Yoshimatsu: to be submitted to R. S. I.Google Scholar
  46. 2.45
    R.Shall: Arch. Tech. Messen 74-13, 117 (1953)Google Scholar
  47. 2.46
    W. Schaaffs: Z.Angew. Phys. 8, 299 (1956)Google Scholar
  48. 2.47
    V. A. Tsukerman, N. I. Zavana, M. A. Manakova: Prib. Tekh. Ekstp. 2, 434 (1966)Google Scholar
  49. 2.48
    F. M. Charbonnier: Advan. X-Ray Anal. 15, 446 (1972)Google Scholar
  50. 2.49
    J. A. Dantzig, R. E. Green Jr.: Advan. X-Ray Anal. 16 (1973)Google Scholar
  51. 2.50
    Q. Johnson, R. N. Keeler, J. W. Lyle: Nature 213, 1114 (1967)Google Scholar
  52. 2.51
    Q.Johnson, A.C.Mitchell: Phys. Rev. Letters 29, 1369 (1972)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag 1977

Authors and Affiliations

  • M. Yoshimatsu
  • S. Kozaki

There are no affiliations available

Personalised recommendations