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Universelle Klassen O(log(MxN))-testbarer iterativer und sequentieller Schaltungen

  • Wolfgang Coy
Schaltwerke
Part of the Lecture Notes in Computer Science book series (LNCS, volume 34)

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5. Literatur

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    G. Hotz, Schaltkreistheorie, Berlin, 1974.Google Scholar
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    A.D. Friedman/P.R. Menon, Fault Detection in Digital Systems, Englewood Cliffs, 1971.Google Scholar
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    W. Görke, Fehlerdiagnose digitaler Schaltungen, Stuttgart, 1973.Google Scholar
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    W. Coy, On the realization of arbitrary switching functions with a linear number of tests, in J. Rosenfeld (Hrsg.), Information Processing 74, Amsterdam, 1974.Google Scholar
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    W. Coy, Zur Konstruktion einfach testbarer Schaltkreise, (erscheint in Elektronische Informationsverarbeitung und Kybernetik).Google Scholar
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    A.D. Friedman, Easily testable iterative systems, IEEE Trans. Comp., Vol. C-22, pp. 1061–1064, Dez. 1973.Google Scholar
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    R.W. Landgraff/ S.S. Yau, Design of diagnosable iterative arrays, IEEE Trans. Comp., Vol. C-21, pp. 1183–1188, Nov. 1972.Google Scholar
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    J.M. Galey/R.E. Norby/J.P. Roth, Techniques for the diagnosis of switching circuit failures, IEEE Trans. Comm. Elec., Vol. 83, pp. 509–514, Sept. 1964.Google Scholar
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    W. Coy, Testkomplexität als Entwurfskriterium, Berichte der Informatik-Forschungsgruppen Nr. AFS-16, Technische Hochschule Darmstadt, Darmstadt, 1975.Google Scholar
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    S.B. Akers, Universal test sets for logic networks, IEEE Trans. Comp. Vol. C-22, No. 9, pp. 835–839, Sept. 1973.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1975

Authors and Affiliations

  • Wolfgang Coy
    • 1
  1. 1.Technische Hochschule DarmstadtGermany

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