LEIRIOS Test Generator: Automated Test Generation from B Models

  • Eddie Jaffuel
  • Bruno Legeard
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4355)


Since 2003, automated test generation from B abstract machines has been trying out in the smart card industry, using LEIRIOS Test Generator (LTG) for SmartCard tool. Now the major card manufacturers, such as Gemalto and Giesecke & Devrient, are regularly deploying model-based testing in their validation processes. The purpose is black-box functional testing: from the specifications (a standard or specific requirements), a B formal model is developed which is the basis for test generation. Generated test cases are then translated into executable test scripts and then run on the application.


Smart Card Test Generation Symbolic Execution Generate Test Case Abstract Machine 


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Copyright information

© Springer-Verlag Berlin Heidelberg 2006

Authors and Affiliations

  • Eddie Jaffuel
    • 1
  • Bruno Legeard
    • 1
    • 2
  1. 1.LEIRIOS Technologies, TEMIS InnovationBesançonFrance
  2. 2.University of Franche-Comté, LIFCBesançonFrance

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