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Worst Case Crosstalk Noise Effect Analysis in DSM Circuits by ABCD Modeling

  • Saihua Lin
  • Huazhong Yang
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4148)

Abstract

In this paper, an ABCD modeling approach is proposed to model the inductive and capacitive coupling effect between the interconnect lines in DSM circuits. Then, a physical aspect model is introduced to analyze the worst case crosstalk noise effect on the delay and rise time of the driver. It is observed that the inductive coupling effect can have a great effect on the timing characteristic of the interconnect line. Experimental results show that the method proposed in this paper differs from the HSPICE simulation with an average error less than 2.5% for both the 50% delay and the rise time.

Keywords

Rise Time Coupling Effect HSPICE Simulation Crosstalk Noise Crosstalk Effect 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2006

Authors and Affiliations

  • Saihua Lin
    • 1
  • Huazhong Yang
    • 1
  1. 1.Electronic Engineering DepartmentTsinghua UniversityBeijingChina

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