Automatic Test Pattern Generation with BOA

  • Tiziana Gravagnoli
  • Fabrizio Ferrandi
  • Pier Luca Lanzi
  • Donatella Sciuto
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4193)


We introduce a Bayesian Optimization algorithm (BOA) for the automatic generation of test sequences (ATPG) for digital circuit. We compare our approach, named BOATPG, to the two most known evolutionary approaches to ATPG (GATTO and STRATEGATE) and the currently most promising non-evolutionary approach to ATPG (namely, SPECTRAL ATPG). We show that our simple approach can easily outperform GATTO and performs as good as a more complex evolutionary approach like STRATEGATE. We also show that when BOATPG is coupled with spectral approach for seeding the population of initial test sequences, the resulting hybrid system, SBOATPG, performs better than the plain BOATPG although the improvements over SPECTRAL ATPG are limited.


Test Sequence Test Vector Fault Coverage Primary Output Sequential Circuit 
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Copyright information

© Springer-Verlag Berlin Heidelberg 2006

Authors and Affiliations

  • Tiziana Gravagnoli
    • 1
  • Fabrizio Ferrandi
    • 1
  • Pier Luca Lanzi
    • 1
  • Donatella Sciuto
    • 1
  1. 1.Dipartimenti di Elettronica e InformazionePolitecnico di MilanoMilanoItaly

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