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Automated Recognition of Low-Level Process: A Pilot Validation Study of Zorro for Test-Driven Development

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Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 3966))

Abstract

Zorro is a system designed to automatically determine whether a developer is complying with the Test-Driven Development (TDD) process. Automated recognition of TDD could benefit the software engineering community in a variety of ways, from pedagogical aids to support the learning of test-driven design, to support for more rigorous empirical studies on the effectiveness of TDD in practice. This paper presents the Zorro system and the results of a pilot validation study, which shows that Zorro was able to recognize test-driven design episodes correctly 89% of the time. The results also indicate ways to improve Zorro’s classification accuracy further, and provide evidence for the effectiveness of this approach to low-level software process recognition.

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References

  1. Johnson, P.M.: Hackystat Framework Home Page, http://www.hackystat.org/

  2. Beck, K.: Test-Driven Development by Example. Addison Wesley, Massachusetts (2003)

    Google Scholar 

  3. George, B., Williams, L.: An Initial Investigation of Test-Driven Development in Industry. ACM Symposium on Applied Computing 3(1), 23 (2003)

    Google Scholar 

  4. Maximilien, E.M., Williams, L.: Accessing Test-Driven Development at IBM. In: Proceedings of the 25th International Conference in Software Engineering, p. 564. IEEE Computer Society, Washington (2003)

    Google Scholar 

  5. Kou, H.: Eclipse Screen Recorder Home Page, http://csdl.ics.hawaii.edu/Tools/Esr/

  6. Osterweil, L.J.: Unifying microprocess and macroprocess research. In: Proceedings of the International Software Process Workshop, pp. 68–74 (2005)

    Google Scholar 

  7. Cook, J.E., Wolf, A.L.: Automating process discovery through event-data analysis. In: ICSE 1995: Proceedings of the 17th international conference on Software engineering, pp. 73–82. ACM Press, New York (1995)

    Chapter  Google Scholar 

  8. Jensen, C., Scacchi, W.: Experience in discovering, modeling, and reenacting open source software development processes. In: Proceedings of the International Software Process Workshop (2005)

    Google Scholar 

  9. Heierman, E., Youngblood, G., Cook, D.: Mining temporal sequences to discover interesting patterns. In: Proceedings of the 2004 International Conference on Knowledge Discovery and Data Mining, Seattle, Washington (2004)

    Google Scholar 

  10. George, B., Williams, L.: A Structured Experiment of Test-Driven Development. Information & Software Technology 46(5), 337–342 (2004)

    Article  Google Scholar 

  11. Muller, M.M., Hagner, O.: Experiment about Test-first Programming. In: Empirical Assesment in Software Engineering (EASE), IEEE Computer Society, Los Alamitos (2002)

    Google Scholar 

  12. Olan, M.: Unit testing: test early, test often. Journal of Computing Sciences in Colleges, The Consortium for Computing in Small Colleges, 319 (2003)

    Google Scholar 

  13. Edwards, S.H.: Using software testing to move students from trial-and-error to reflection-in-action. In: Proceedings of the 35th SIGCSE technical symposium on Computer science education, pp. 26–30. ACM Press, New York (2004)

    Chapter  Google Scholar 

  14. Geras, A., Smith, M., Miller, J.: A Prototype Empirical Evaluation of Test Driven Development. In: Software Metrics, 10th International Symposium on (METRICS 2004), p. 405. IEEE Computer Society, USA (2004)

    Chapter  Google Scholar 

  15. Pancur, M., Ciglaric, M.: Towards empirical evaluation of test-driven development in a university environment. In: Proceedings of EUROCON 2003, IEEE, Los Alamitos (2003)

    Google Scholar 

  16. Johnson, P.M., Kou, H., Paulding, M.G., Zhang, Q., Kagawa, A., Yamashita, T.: Improving software development management through software project telemetry. IEEE Software (2005)

    Google Scholar 

  17. Johnson, P.M., Paulding, M.G.: Understanding HPCS development through automated process and product measurement with Hackystat. In: 2nd Workshop on Productivity and Performance in High-End Computing (P-PHEC) (2005)

    Google Scholar 

  18. Johnson, P.M., Kou, H., Agustin, J.M., Zhang, Q., Kagawa, A., Yamashita, T.: Practical automated process and product metric collection and analysis in a classroom setting: Lessons learned from Hackystat-UH. In: Proceedings of the 2004 International Symposium on Empirical Software Engineering, Los Angeles, California (2004)

    Google Scholar 

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© 2006 Springer-Verlag Berlin Heidelberg

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Kou, H., Johnson, P.M. (2006). Automated Recognition of Low-Level Process: A Pilot Validation Study of Zorro for Test-Driven Development. In: Wang, Q., Pfahl, D., Raffo, D.M., Wernick, P. (eds) Software Process Change. SPW 2006. Lecture Notes in Computer Science, vol 3966. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11754305_35

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  • DOI: https://doi.org/10.1007/11754305_35

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-34199-4

  • Online ISBN: 978-3-540-34201-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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