An Efficient Delay Metric on RC Interconnects Under Saturated Ramp Inputs

  • Ki-Young Kim
  • Seung-Yong Kim
  • Seok-Yoon Kim
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 3983)


This paper presents a simple and fast delay metric RC-class interconnects under step and saturated ramp inputs. The proposed RC delay metric under step input, called MECM(Modified ECM), provides a reasonable accuracy without using circuit moments. The next RC delay metric under saturated ramp inputs, called FDM(Fast Delay Metric), can estimate delay times at an arbitrary node using a simple closed-form expression and is extended from MECM easily. As compared with similar techniques proposed in previous researches, it is shown that the FDM technique involves much lower computational complexity for a similar accuracy. As the number of circuit nodes increases, there will be a significant difference in estimation times of RC delay between the previous techniques based on two circuit moments and the FDM which do not depend on circuit moments.


Step Input Estimate Delay Time Circuit Node Ramp Input Place Route 
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Copyright information

© Springer-Verlag Berlin Heidelberg 2006

Authors and Affiliations

  • Ki-Young Kim
    • 1
  • Seung-Yong Kim
    • 1
  • Seok-Yoon Kim
    • 1
  1. 1.Department of ComputerSoongsil UniversitySeoulKorea

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