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A New Method for Testing Embedded Software with Scenario Pattern

  • Yu Ren
  • Tongwu Li
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 3942)

Abstract

This paper presents a new way to test embedded software with a scenario pattern-based method. It also introduces some concepts of scenario and scenario patterns, and formalizes the embedded software with scenario model ACDATE. The verification patterns are built with embedded system, and are tested with the samples of basic scenario pattern. This paper shows the process about how to verify the embedded software.

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References

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Copyright information

© Springer-Verlag Berlin Heidelberg 2006

Authors and Affiliations

  • Yu Ren
    • 1
  • Tongwu Li
    • 1
  1. 1.College of ComputerHangzhou Dianzi UniversityZhejiangChina

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