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Automatic Test Generation on a (U)SIM Smart Card

  • Céline Bigot
  • Alain Faivre
  • Christophe Gaston
  • Julien Simon
Part of the Lecture Notes in Computer Science book series (LNCS, volume 3928)

Abstract

Usually, testing smart card software is carried-out by specialized engineers in a proprietary language. Testing represents generally half of smart card development effort. With the increasing use of semi-formal and formal modeling languages, such as UML, and the emergence of automatic test generators in the industry, we have studied a way to adapt these techniques for smart card. In this article, we present an automatic test generator, named AGATHA, and its architecture, which can handle UML specifications. Then, we suggest a way to model (U)SIM smart card functionalities in UML. We use the test generator on our (U)SIM smart card UML models and automatically produce our first test cases.

Keywords

Smart Card Path Condition Symbolic Execution Generate Test Case Symbolic State 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© IFIP International Federation for Information Processing 2006

Authors and Affiliations

  • Céline Bigot
    • 1
  • Alain Faivre
    • 2
  • Christophe Gaston
    • 2
  • Julien Simon
    • 1
  1. 1.Oberthur Card Systems, R&D – EMCNanterreFrance
  2. 2.CEA/LIST, SaclayGif sur YvetteFrance

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