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Iberoamerican Congress on Pattern Recognition

CIARP 2005: Progress in Pattern Recognition, Image Analysis and Applications pp 945–953Cite as

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Edge Detection in Contaminated Images, Using Cluster Analysis

Edge Detection in Contaminated Images, Using Cluster Analysis

  • Héctor Allende18 &
  • Jorge Galbiati19 
  • Conference paper
  • 831 Accesses

  • 1 Citations

Part of the Lecture Notes in Computer Science book series (LNIP,volume 3773)

Abstract

In this paper we present a method to detect edges in images. The method consists of using a 3x3 pixel mask to scan the image, moving it from left to right and from top to bottom, one pixel at a time. Each time it is placed on the image, an agglomerative hierarchical cluster analysis is applied to the eight outer pixels. When there is more than one cluster, it means that window is on an edge, and the central pixel is marked as an edge point. After scanning all the image, we obtain a new image showing the marked pixels around the existing edges of the image. Then a thinning algorithm is applied so that the edges are well defined. The method results to be particularly efficient when the image is contaminated. In those cases, a previous restoration method is applied.

Keywords

  • Edge Detection
  • Edge Point
  • Central Pixel
  • Pattern Recognition Letter
  • Agglomerative Hierarchical Cluster Analysis

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Author information

Authors and Affiliations

  1. Departamento de Informática, Universidad Técnica Federico Santa María, Casilla 110-V, Valparaíso

    Héctor Allende

  2. Instituto de Estadística, Casilla, Pontificia Universidad Católica de Valparaíso, 4059, Valparaíso, Chile

    Jorge Galbiati

Authors
  1. Héctor Allende
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  2. Jorge Galbiati
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Editor information

Editors and Affiliations

  1. Dept. System Engineering and Automation, Universitat Politècnica de Catalunya (UPC) Barcelona, Spain

    Alberto Sanfeliu

  2. Pattern Recognition Group, ICIMAF, Havana, Cuba

    Manuel Lazo Cortés

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© 2005 Springer-Verlag Berlin Heidelberg

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Cite this paper

Allende, H., Galbiati, J. (2005). Edge Detection in Contaminated Images, Using Cluster Analysis. In: Sanfeliu, A., Cortés, M.L. (eds) Progress in Pattern Recognition, Image Analysis and Applications. CIARP 2005. Lecture Notes in Computer Science, vol 3773. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11578079_97

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  • DOI: https://doi.org/10.1007/11578079_97

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-29850-2

  • Online ISBN: 978-3-540-32242-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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