Invited Presentation II: Experiences in Applying Model Based System Testing Generation
The goal of this presentation is to illustrate the benefits of using an automated, model-based approach for improving system test design and generation. Our approach, TDE/UML, automatically generates system tests from behavioral models of an application using the Unified Modeling Language (UML.). TDE/UML builds on and combines existing techniques for data coverage and graph coverage. We focus here on the results of applying TDE/UML in diverse Siemens projects: its cost benefits and its fault detection capabilities.