Invited Presentation II: Experiences in Applying Model Based System Testing Generation

  • Marlon Vieira
Part of the Lecture Notes in Computer Science book series (LNCS, volume 3713)


The goal of this presentation is to illustrate the benefits of using an automated, model-based approach for improving system test design and generation. Our approach, TDE/UML, automatically generates system tests from behavioral models of an application using the Unified Modeling Language (UML.). TDE/UML builds on and combines existing techniques for data coverage and graph coverage. We focus here on the results of applying TDE/UML in diverse Siemens projects: its cost benefits and its fault detection capabilities.

Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • Marlon Vieira
    • 1
  1. 1.Siemens Corporate Research 

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