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Invited Presentation II: Experiences in Applying Model Based System Testing Generation

  • Marlon Vieira
Part of the Lecture Notes in Computer Science book series (LNCS, volume 3713)

Abstract

The goal of this presentation is to illustrate the benefits of using an automated, model-based approach for improving system test design and generation. Our approach, TDE/UML, automatically generates system tests from behavioral models of an application using the Unified Modeling Language (UML.). TDE/UML builds on and combines existing techniques for data coverage and graph coverage. We focus here on the results of applying TDE/UML in diverse Siemens projects: its cost benefits and its fault detection capabilities.

Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • Marlon Vieira
    • 1
  1. 1.Siemens Corporate Research 

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