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Consensus-Based Evaluation for Fault Isolation and On-line Evolutionary Regeneration

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Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 3637))

Abstract

While the fault repair capability of Evolvable Hardware (EH) approaches have been previously demonstrated, further improvements to fault handling capability can be achieved by exploiting population diversity during all phases of the fault handling process. A new paradigm for online EH regeneration using Genetic Algorithms (GAs) called Consensus Based Evaluation (CBE) is developed where the performance of individuals is assessed based on broad consensus of the population instead of a conventional fitness function. Adoption of CBE enables information contained in the population to not only enrich the evolutionary process, but also support fault detection and isolation. On-line regeneration of functionality is achieved without additional test vectors by using the results of competitions between individuals in the population. Relative fitness measures support adaptation of the fitness evaluation procedure to support graceful degredation even in the presence of unpredictable changes in the operational environment, inputs, or the FPGA application. Application of CBE to FPGA-based multipliers demonstrates 100% isolation of randomly injected stuckat faults and evolution of a complete regeneration within 135 repair iterations while precluding the propagation of any discrepant output. The throughput of the system is maintained at 85.35% throughout the repair process.

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References

  1. Keymeulen, D., Stoica, A., Zebulum, R.: Fault-Tolerant Evolvable Hardware using Field Programmable Transistor Arrays. IEEE Transactions on Reliability 49(3) (September 2000)

    Google Scholar 

  2. Vigander, S.: Evolutionary Fault Repair of Electronics in Space Applications., Dissertation, Norwegian University Sci. Tech., Trondheim, Norway (February 28, 2001)

    Google Scholar 

  3. Lohn, J.D., Larchev, G., DeMara, R.F.: A Genetic Representation for Evolutionary Fault Recovery in Virtex FPGAs. In: Proceedings of the 5th International Conference on Evolvable Systems (ICES), Trondheim, Norway, March 17-20 (2003)

    Google Scholar 

  4. Lohn, J.D., Larchev, G., DeMara, R.F.: Evolutionary Fault Recovery in a Virtex FPGA Using a Representation That Incorporates Routing. In: Proceedings of 17th International Parallel and Distributed Processing Symposium, Nice, France (April 22-26, 2003)

    Google Scholar 

  5. Garvie, M., Thompson, A.: Scrubbing away transients and Jiggling around the permanent: Long survival of FPGA systems through evolutionary self-repair. In: Proceedings of the 10th IEEE Intl. On-Line Testing Symposium, pp. 155–160 (2004)

    Google Scholar 

  6. Shanthi, A.P., Parthasarathi, R.: Exploring FPGA Structures for Evolving Fault Tolerant Hardware. In: Proceedings of the 5th NASA / DoD Workshop on Evolvable Hardware, pp. 184–191 (2003)

    Google Scholar 

  7. Yao, X., Liu, Y., Darwen, P.: How to make best use of evolutionary learing. In: Stocker, R., Jelinek, H., Durnota, B. (eds.) Complex Systems: From Local Interactions to Global Phenomena, Amsterdam, pp. 229–242 (1996)

    Google Scholar 

  8. Yao, X., Liu, Y.: Making use of population information in evolutionary artificial neural networks. IEEE Trans. On Systems, Man and Cybernetics, Part B: Cybernetics 28(3), 417–425 (1998)

    MathSciNet  Google Scholar 

  9. Yao, X., Liu, Y.: Getting most of evolutionary approaches. In: Stoica, A., Lohn, J., Kata, R., Keymeulen, D., Zebulum, R. (eds.) Proceedings of 2002 NASA/DOD Conference onEvolvable Hardware, July 15-18, pp. 8–14. IEEE Computer Society, Alexandria (2002)

    Google Scholar 

  10. Layezll, P., Thompson, A.: Understanding the inherent Qualities of Evolved Circuits: Evolutionary History as a Predictor of Fault Tolerance. In: Miller, J.F., Thompson, A., Thompson, P., Fogarty, T.C. (eds.) ICES 2000. LNCS, vol. 1801, pp. 133–144. Springer, Heidelberg (2000)

    Chapter  Google Scholar 

  11. Mitra, S., McCluskey, E.J.: Which Concurrent Error Detection Scheme to Choose? In: Proceedings of 2000 International Test Conference, Atlantic City, NJ, October 3-5, pp. 985–994 (2000)

    Google Scholar 

  12. Miller, J.F., Thomson, P.: Cartesian Genetic Programming. In: Poli, R., Banzhaf, W., Langdon, W.B., Miller, J., Nordin, P., Fogarty, T.C. (eds.) EuroGP 2000. LNCS, vol. 1802, pp. 121–132. Springer, Heidelberg (2000)

    Chapter  Google Scholar 

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© 2005 Springer-Verlag Berlin Heidelberg

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Zhang, K., DeMara, R.F., Sharma, C.A. (2005). Consensus-Based Evaluation for Fault Isolation and On-line Evolutionary Regeneration. In: Moreno, J.M., Madrenas, J., Cosp, J. (eds) Evolvable Systems: From Biology to Hardware. ICES 2005. Lecture Notes in Computer Science, vol 3637. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11549703_2

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  • DOI: https://doi.org/10.1007/11549703_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-28736-0

  • Online ISBN: 978-3-540-28737-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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