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Shape-Based Co-occurrence Matrices for Defect Classification

  • Rami Rautkorpi
  • Jukka Iivarinen
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 3540)

Abstract

This paper discusses two statistical shape descriptors, the Edge Co-occurrence Matrix (ECM) and the Contour Co-occurrence Matrix (CCM), and their use in surface defect classification. Experiments are run on two image databases, one containing metal surface defects and the other paper surface defects. The extraction of Haralick features from the matrices is considered. The descriptors are compared to other shape descriptors from e.g. the MPEG-7 standard. The results show that the ECM and the CCM give superior classification accuracies.

Keywords

Shape Descriptor Edge Image Edge Pixel Defect Image Percentage Unit 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • Rami Rautkorpi
    • 1
  • Jukka Iivarinen
    • 1
  1. 1.Laboratory of Computer and Information ScienceHelsinki University of TechnologyFinland

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