Abstract
Digital logic forms the basis of many electronic circuits and systems from simple decoding logic through to complex microprocessor based systems. Whatever the application and complexity of the design, digital logic testing is based on a number of core principles and, provided that the design can be suitably accessed, particular test stimuli applied and the results observed, the device test problem can be addressed.
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© 2006 Springer-Verlag London Limited
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(2006). Digital Logic Test. In: Integrated Circuit Test Engineering. Springer, London. https://doi.org/10.1007/1-84628-173-3_3
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DOI: https://doi.org/10.1007/1-84628-173-3_3
Publisher Name: Springer, London
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