Abstract
Using the design techniques presented in the previous chapters, many circuitand device-related errors inCMOSsmart temperature sensors can be sufficiently reduced. However, variations in the base-emitter voltage of the bipolar transistors (as a result of process spread and mechanical stress) will ultimately limit the achievable accuracy. Trimming, and an associated calibration procedure, are needed to correct for these variations. If high accuracy is desired, traditional calibration techniques are time-consuming and therefore costly. This chapter presents three alternative calibration techniques that combine accuracy with low production costs: batch calibration, calibration based on ΔV BE measurement, and voltage reference calibration.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
J. V. Nicholas and D. R. White, Traceable Temperatures. Chichester, England: John Wiley & Sons, 1994.
F. Fruett and G. C. M. Meijer, The Piezojunction Effect in Silicon Integrated Circuits and Sensors. Boston: Kluwer Academic Publishers, May 2002.
B. Abesingha, G. A. Rincón-Mora, and D. Briggs, “Voltage shift in plastic-packaged bandgap references,” IEEE Transactions on Circuits and Systems–Part II: Analog and Digital Signal Processing, vol. 49, no. 10, pp. 681–685, Oct. 2002.
F. Fruett, G. C. M. Meijer, and A. Bakker, “Minimization of the mechanical-stress-induced inaccuracy in bandgap voltage references,” IEEE Journal of Solid-State Circuits, vol. 38, no. 7, pp. 1288–1291, July 2003.
M. A. P. Pertijs, A. Bakker, and J. H. Huijsing, “A high-accuracy temperature sensor with second-order curvature correction and digital bus interface,” in Proc. ISCAS, May 2001, pp. 368–371.
M. A. P. Pertijs and J. H. Huijsing, “Transistor temperature measurement for calibration of integrated temperature sensors,” in Proc. IMTC, May 2002, pp. 755–758.
J. M. Audy and B. Gilbert, “Multiple sequential excitation temperature sensing method and apparatus,” U.S. Patent 5 195 827, Mar. 4, 1993.
G.Wang and G. C.M. Meijer, “Temperature characteristics of bipolar transistors fabricated in CMOS technology,” Sensors and Actuators, vol. 87, pp. 81–89, Dec. 2000.
M. A. P. Pertijs, G. C. M. Meijer, and J. H. Huijsing, “Precision temperature measurement using CMOS substrate PNP transistors,” IEEE Sensors Journal, vol. 4, no. 3, pp. 294–300, June 2004.
G. C. M. Meijer, “Integrated circuits and components for bandgap references and temperature transducers,” Ph.D. dissertation, Delft University of Technology, Delft, The Netherlands, Mar. 1982.
G. A. Rincón-Mora, Voltage References. Piscataway, New York: IEEE Press, 2002.
M. A. P. Pertijs and J. H. Huijsing, “Digital temperature sensors and calibration thereof,” U.K. Patent Application 0 507 820.9, 2005.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer
About this chapter
Cite this chapter
Pertijs, M.A., Huijsing, J.H. (2006). CALIBRATION TECHNIQUES. In: PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY. Analog Circuits and Signal Processing. Springer, Dordrecht . https://doi.org/10.1007/1-4020-5258-8_6
Download citation
DOI: https://doi.org/10.1007/1-4020-5258-8_6
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-5257-6
Online ISBN: 978-1-4020-5258-3
eBook Packages: EngineeringEngineering (R0)