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IMPROVED ELECTROMAGNETIC IMMUNITY CIRCUIT DESIGN

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Analog Circuit Design

Abstract

The design of integrated circuits for automotive applications has to meet challenging EMI requirements. In order to determine the cause of most common failures it is necessary to perform research in order to improve concept, design and layout of new or present products. In this article the concept/design analysis and results of fundamental blocks such as comparator/opamp, internal voltage supply and bandgap are presented.

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References

  1. http://www.iso.org/iso/en/CatalogueDetailPage.CatalogueDetail?CS- NUMBER=38302&ICS1=43&ICS2=40&ICS3=10.

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  2. M. Stecher et al., “Key Features of a Smart Power Technology for Automotive Applications,” Conference on Integrated Power Systems CIPS 2002, Bremen, Germany

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  3. H. Zitta, W. Horn, C. Lenzhofer, “Automotive IC-Design”, Analog Circuit Design, Kluwer Academic Publisher 2004 pp.137–151.

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© 2007 Springer

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Bernardon, D. (2007). IMPROVED ELECTROMAGNETIC IMMUNITY CIRCUIT DESIGN. In: Van Roermund, A.H., Casier, H., Steyaert, M. (eds) Analog Circuit Design. Springer, Dordrecht. https://doi.org/10.1007/1-4020-5186-7_10

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  • DOI: https://doi.org/10.1007/1-4020-5186-7_10

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-4020-5185-2

  • Online ISBN: 978-1-4020-5186-9

  • eBook Packages: EngineeringEngineering (R0)

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