Abstract
The program TexPat was developed for quantification of texture patterns in order to facilitate, speed up and improve the accuracy of texture pattern analysis. The program introduces new approaches for automated detection of centre and symmetry axes and simplifies the process of indexing and calculating the unit cell parameters. The main algorithm of the program uses the symmetry properties of the texture pattern images. The successive steps help to process the reflections of the pattern using the peak shape extracted from well-separated peaks. The program generates a list of unit cell parameters, all processed reflections with Miller indices and their integrated intensities. The quality of the data obtained by TexPat is evaluated numerical and found to be sufficient for crystal structure determination.
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Oleynikov, P., Hovmöller, S., Zou, X. (2006). Quantification of Texture Patterns. In: Weirich, T.E., Lábár, J.L., Zou, X. (eds) Electron Crystallography. NATO Science Series II: Mathematics, Physics and Chemistry, vol 211. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3920-4_9
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DOI: https://doi.org/10.1007/1-4020-3920-4_9
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