Abstract
The late 1990’s saw an increasing use of virtual test environments in the test development community, to allow quicker development of mixed signal test programs. Following the industry downturn in 2001, automatic test equipment (ATE) vendors have had to reassess their support for virtual test. This paper will detail an alternative approach developed to address the simulation of mixed signal test programs.
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© 2006 Springer
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Walsh, D., Joyce, A., Patrick, D., Limerick, A.D. (2006). Simulation of Functional Mixed Signal Test. In: Steyaert, M., Huijsing, J., van Roermund, A. (eds) Analog Circuit Design. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3885-2_12
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DOI: https://doi.org/10.1007/1-4020-3885-2_12
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-3884-6
Online ISBN: 978-1-4020-3885-3
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