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6. References
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Woodworth, A.A., Peng, C.Y., Stinespring, C.D., Meehan, K. (2005). Characterization of the Metal-Semiconductor Interface for Silicon Carbide Based Sensors. In: Vaseashta, A., Dimova-Malinovska, D., Marshall, J.M. (eds) Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology. NATO Science Series II: Mathematics, Physics and Chemistry, vol 204. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3562-4_41
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DOI: https://doi.org/10.1007/1-4020-3562-4_41
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