This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
International Technology Roadmap for Semiconductors Edition 2002 (accessible through website public.itrs.net)
see, for example, the website www.almaden.ibm.com/sst
K. Koike & K. Hayakawa-Jap. J. Appl. Phys.23, L187 (1984)
L. Reimer-Scanning Electron Microscopy, Springer Verlag, Berlin (1985)
H.J. Güuntherodt & R. Wiesendanger eds-Scanning Tunneling Microscopy, Springer Verlag, Berlin (1992)
Y. Martin & H.K. Wickramasinghe-Phys. Rev. Lett.50, 1455 (1987)
M. bode, M. Getzlaff & R. Wiesendanger-Phys. Rev. Lett.81, 4256 (1998)
E. Bauer & W. Telieps-In “Emission and low energy reflection electron microscopy”, A. Howie & U. Valdré eds, Plenum Press, New York (1988)
M. Brüche-Z. f. Naturforschung11, 287 (1934)
L.H. Veneklasen-Rev. Sci. Instr.63, 5513 (1992)
C.M. Schneider & G. Schönhense-Rep. Prog. Phys.65 (2002) 1785
R. Fink, M.R. Weiss, E. Umbach, D. Preikszas, H. Rose, R. Spehr, P. Hartel, W. Engel, R. Degenhardt, R. Wichtendahl, H. Kuhlenbeck, W. Erlebach, K. Ihmann, R. Schlögl, H.J. Freund, A.M. Bradshaw, G. Lilienkamp, T. Schmidt, E. Bauer & G. Benner-J. Elec. Spec.84, 231 (1997)
G.F. Rempfer, W.P. Skoczylas & O.H. Griffith-Ultramicroscopy36, 196 (1991)
S. Anders, H.A. Padmore, R.M. Duarte, T. Renner, T. Stammler, A. Scholl, M.R Scheinfein, J. Stöhr, L. Séve & B. Sinkovic-Rev. Sci. Instr.70, 3973 (1999)
S.A. Nepijko, N.N. Sedov & G. Schönhense-Adv. Imag. Electr. Phys.113, 205 (2000)
W. Swiech, G. H. Fecher, C. Ziethen, O. Schmidt, G. Schönhense, K. Grzelakowski, C. M. Schneider, R. Frömter & J. Kirschner-J. Elec. Spec.84, 171 (1997)
C. Ziethen, O. Schmidt, G.K.L. Marx, G. Schönhense, R. Frömter, J. Gilles, J. Kirschner, C.M. Schneider, & O. Gröning-J. Elec. Spec.107, 261 (2000)
J. Stöhr & S. Anders-IBM J. Res. Develop.44, 535 (2000)
G.V. Spivak, T.N. Dombrovskaia & N.N. Sedov-Sov. Phys. Dokl.2, 120 (1957)
G.V.D. Laan, B.T. Thole, G.A. Sawatzky, J.B. Goedkoop, J.C. Fuggle, J.M. Esteva, R. Karnatak, J.P. Remeika & H.A. Dabkowska-Phys. Rev. B34, 6529 (1986)
G. Schütz, W. Wagner, W. Wilhelm, P. Kienle, R. Zeller, R. Frahm & G. MaterlikPhys. Rev. Lett.58, 737 (1987)
C.T. Chen, F. Sette, Y. Ma & S. Modesti-Phys. Rev. B42, 7262 (1990)
J. Kessler-Polarized Electrons, Springer Verlag, Berlin (1985)
C.M. Schneider, K. Holldack, M. Kinzler, M. Grunze, H.P. Oepen, F. Schäfers, H. Petersen, K. Meinel & J. Kirschner-Appl. Phys. Lett.63, 2432 (1993)
J. Stöhr, Y. Wu, M.G. Samant, B.D. Hermsmeier, G. Harp, S. Koranda, D. Dunham & B.P. Tonner-Science259, 658 (1993)
R. Nakajima, J. Stöhr & Y.U. Idzerda-Phys. Rev. B59, 6421 (1999)
A. Hubert & R. Schäfer-Magnetic Domains, Springer Verlag, Berlin (1998)
C. M. Schneider, R. Frömter, C. Ziethen, W. Swiech, N. B. Brookes, G. Schönhense & J. Kirschner-Mat. Res. Soc. Symp. Proc.475, 381 (1997)
H.P. Oepen & J. Kirschner-Phys. Rev. Lett.62, 819 (1989)
M.R. Scheinfein, J. Unguris, R.J. Celotta & D.T. Pierce-Phys. Rev. Lett.63, 668 (1989)
S. Chikazumi-Physics of Magnetism, Wiley & Sons, New York (1964)
R.W. DeBlois & J.C.D. Graham-J. Appl. Phys.29, 931 (1958)
H.P. Oepen & J. Kirschner-Scanning Microscopy5, 1 (1991)
J. Hunter Dunn, D. Arvanitis, N. Maartensson, M. Tischer, F. May, M. Russo & K. Baberschke-J. Phys.: Condens. Matter7, 1111 (1995)
J. Unguris, R.J. Celotta & D.T. Pierce-Phys. Rev. Lett.67, 140 (1991)
C.M. Schneider, K. Meinel, J. Kirschner, M. Neuber, C. Wilde, M. Grunze, K. Holldack, Z. Celinski, & F. Baudelet-J. Magn. Magn. Mater.162, 7 (1996)
W. Kuch, R. Frömter, J. Gilles, D. Hartmann, C. Ziethen, C.M. Schneider, G. Schönhense, W. Swiech, & J. Kirschner-Surf. Rev. Lett.5, 1241 (1998)
D. Alders, L.H. Tjeng, F.C. Voogt, T. Hibma, G.A. Sawatzky, C.T. Chen, J. Vogel, M. Sacchi & S. Iacobucci-Phys. Rev. B57, 11623 (1998)
D. Spanke, V. Solinus, D. Knabben, F.U. Hillebrecht, F. Ciccacci, L. Gregoratti & M. Marsi-Phys. Rev. B58, 5201 (1998)
J. Stöhr, A. Scholl, T.J. Regan, S. Anders, J. Lüning, M.R. Scheinfein, H.A. Padmore & R.L. White-Phys. Rev. Lett.83, 1862 (1999)
F. Nolting, A. Scholl, J. Sthr, J. Fompeyrine, H. Siegwart, J.-P. Locquet, S. Anders, J. Lüning, E.E. Fullerton, M.F. Toney, M.R. Scheinfein & H.A. Padmore-Nature405, 767 (2000)
F.U. Hillebrecht, H. Ohldag, N.B. Weber, C. Bethke, U. Mick, M. Weiss, & J. Bahrdt-Phys. Rev. Lett.86, 3419 (2001)
D. Alders, J. Vogel, C. Levelut, S.D. Peacor, T. Hibma, M. Sacchi, L.H. Tjeng, C. T. Chen, G. Van der Laan, B.T. Thole & G.A. Sawatzky-Eur. Phys. Lett.32, 259 (1995)
H. Komatsu & M. Ishigame-J. Mat. Sci.20, 4027 (1985)
G. Schönhense-J. Phys.: Condens. Matter11, 9517 (1999)
E. Bauer-J. Phys.: Condens. Matter13, 11391 (2001)
Th. Schmidt, U. Groh, R. Fink, E. Umbach, O. Schaff, W. Engel, B. Richter, H. Kuhlenbeck, R. Schlögl, H. J. Freund, A.M. Bradshaw, D. Preikszas, P. Hartel, R. Spehr, H. Rose, G. Lilienkamp & E. Bauer-Surf. Rev. Lett.9, 223 (2002)
S. Günther, B. Kaulich, L. Gregoratti & M. Kiskinova-Prog. Surf. Sci.70, 187 (2002)
A. Krasyuk, A. Oelsner, S. Nepijko, A. Kuksov, C.M. Schneider & G. Schönhense-Appl. Phys. A76, 836 (2003)
J. Vogel, W. Kuch, M. Bonfim, J. Camarero, Y. Pennec, F. Offi, K. Fukumoto, J. Kirschner, A. Fontaine & S. Pizzini-Appl. Phys. Lett.82, 2299 (2003)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer
About this chapter
Cite this chapter
Schneider, C.M. (2006). Soft X-Ray Photoelectron Emission-Microscopy (X-PEEM). In: Hippert, F., Geissler, E., Hodeau, J.L., Lelièvre-Berna, E., Regnard, JR. (eds) Neutron and X-ray Spectroscopy. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3337-0_8
Download citation
DOI: https://doi.org/10.1007/1-4020-3337-0_8
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-3336-0
Online ISBN: 978-1-4020-3337-7
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)