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Anomalous Scattering and Diffraction Anomalous Fine Structure

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Neutron and X-ray Spectroscopy

6. Conclusion

Anomalous or resonant diffraction can be used to obtain much information about a given element in a crystal. However this information requires sophisticated tools (synchrotron rings), accurate experiments and complex analysis. This is a price that still needs to be paid to go beyond the anomalous complexity and/or correction and to fully extract and use this rich “anomalous” information. However, several applications are nowadays available for the MAD method to determine experimentally the phase and for the contrast method that uses the chemical sensitivity of resonant diffraction. This is also the case for the DAFS method: the fine structure of the diffracted intensity as a function of the energy can now be analyzed in very complex structures or systems.

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Authors and Affiliations

  1. Laboratoire de Cristallographie, CNRS, Grenoble, France

    J. L. Hodeau

  2. Département de recherche fondamentale sur la matière condensée, CEA, Grenoble, France

    H. Renevier

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  1. Institut National Physique, St. Martin d’Hères, France

    Françoise Hippert

  2. Université J. Fourier de Grenoble, St. Martin d’Hères, France

    Erik Geissler  & Jean-René Regnard  & 

  3. Laboratoire de Cristallographie, CNRS, Grenoble, France

    Jean Louis Hodeau

  4. Institut Laue Langevin, Grenoble, France

    Eddy Lelièvre-Berna

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Hodeau, J.L., Renevier, H. (2006). Anomalous Scattering and Diffraction Anomalous Fine Structure. In: Hippert, F., Geissler, E., Hodeau, J.L., Lelièvre-Berna, E., Regnard, JR. (eds) Neutron and X-ray Spectroscopy. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3337-0_7

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