Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials

  • S.V. Kalinin
  • D.A. Bonnell
Conference paper
Part of the NATO Science Series II: Mathematics, Physics and Chemistry book series (NAII, volume 186)


Piezoresponse Force Microscop Lateral Bias Electrostatic Force Microscop Electroceramic Material Surface Topo 
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Copyright information

© Kluwer Academic Publishers 2005

Authors and Affiliations

  • S.V. Kalinin
    • 1
  • D.A. Bonnell
    • 2
  1. 1.Condensed Matter Sciences DivisionOak Ridge National LaboratoryOak Ridge
  2. 2.Department of Materials Science and EngineeringThe University of PennsylvaniaPhiladelphia

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