Abstract
The magnetic properties and the magnetoresistance in correlation with microstructural properties of [NiFe(t)/Cu(s)/NiFe(t)]n and [NiFe(t)/Mo(s)/NiFe(t)] multilayers have been investigated. The thickness (t) of permalloy (Ni 80% Fe 20%) layers was ranged from 4 to 12 nm, while the copper and molybdenum layers (s) was ranged from 3 to 8 nm. The multilayers exhibit magnetoresistive properties correlated with microstructure and roughness at the interface of permalloy film and cooper or molybdenum layer. By decreasing of the NiFe layer thickness and by increasing of the non-magnetic interlayer thickness, the influence of interfacial intermixing effects on magnetic properties become more important.
Although the thickness of layers has the leading part for magnitude of Giant Magnetoresistance effect, the microstructural properties of interfaces and the grain boundaries scattering must not be neglected.
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© 2005 Kluwer Academic Publishers
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Neamtu, J., Volmer, M. (2005). Magnetoresistance and Microstructure of Magnetic Thin Film Multilayers. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_26
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DOI: https://doi.org/10.1007/1-4020-3019-3_26
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-3017-8
Online ISBN: 978-1-4020-3019-2
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