Abstract
Silicon on Insulator technology has found widespread use in high temperature electronic applications in the automotive, aerospace and oil well logging industries. To ensure the integrity and reliability of these devices in their applications, a major challenge is to be able to test the devices, economically, under similar operating conditions to those they would experience in the field, that is in operating temperatures of around 300C. Furthermore, due to the criticality of the applications it is also necessary to perform stress testing to identify potentially weak devices before they are used in the field. Several companies now produce ‘dynamic burn-in’ systems, however, these are very expensive. Consequently, there is a need for the development of low cost bench top high temperature test systems which can be used for high temperature testing of prototype devices to be used in ‘harsh environments'.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
R. Rajsuman,’ IDDQ Testing for CMOS VLSI', IEEE Proceedings, Volume 88 Number 4, April 2000, pp 544–566.
A.C. Miller, ‘IDDQ Testing Deep Submicron Integrated Circuits', Proceedings International Test Conference, 1999, pp 724–729.
A.E Gattiker, W. Maly, ‘Current Signature Applications', Proceedings International Test Conference, 1998, pp 1168–1177.
P. Maxwell, P. O'Neill,’ Current Ratio — A Self Scaling Technique for production IDDQ Testing', Proceedings International Test Conference, 1999, pp 738–746.
A.K. Sharma,’ Semiconductor memories: Technology, Testing and Reliability', IEEE Press, ISBN 0-7803-1600-4.
V. Stopjakova, H. Manhaeve, M. Sidiropulos, ‘On —Chip transient Current Monitor for Testing Low Voltage CMOS ICs', Proceedings Design Automation and Test Europe, March 1999, pp 538–542.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2005 Kluwer Academic Publishers
About this paper
Cite this paper
Russell, G., Li, Y., Bahr, H. (2005). Low Cost High Temperature Test System for SOI Devices. In: Flandre, D., Nazarov, A.N., Hemment, P.L. (eds) Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment. NATO Science Series II: Mathematics, Physics and Chemistry, vol 185. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3013-4_26
Download citation
DOI: https://doi.org/10.1007/1-4020-3013-4_26
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-3011-6
Online ISBN: 978-1-4020-3013-0
eBook Packages: EngineeringEngineering (R0)