Abstract
The paper describes the principles of operation and the expected performance of correlation spectrum analyzers in the detection and measurement of stationary noise produced by passive or active devices under test (DUT). It is shown that a sensitivity of few pV/vHz in voltage noise measurements and of few fA/vHz in current noise measurements may be reached with a properly long measurement time rarely exceeding few hours. The paper highlights the role of the DUT impedance and of the amplifiers noise sources in setting the sensitivity limit of the instrument as given by the generation of spurious correlated signals that feed both channels.
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© 2004 Kluwer Academic Publisher
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Ferrari, G., Sampietro, M. (2004). Correlation Spectrum Analyzer: Pringiples and Limits in Noise Measurements. In: Sikula, J., Levinshtein, M. (eds) Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices. NATO Science Series II: Mathematics, Physics and Chemistry, vol 151. Springer, Dordrecht. https://doi.org/10.1007/1-4020-2170-4_24
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DOI: https://doi.org/10.1007/1-4020-2170-4_24
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-2169-5
Online ISBN: 978-1-4020-2170-1
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