Skip to main content

Bringing Theory to Experiment in SFM

  • Chapter
Scanning Probe Microscopy

Part of the book series: NanoScience and Technology ((NANO))

  • 2726 Accesses

6.5 Summary

In this chapter we have shown how theorists actually proceed from a given SFM experimental result to arrive at a realistic simulation of the imaging process. It turned out that the key to successful modeling lies in the ability to successively refine the theoretical model, especially with regard to allowing flexibility in tip selection. This process is inherently iterative: it is usually not possible to arrive at a consistent model that agrees with experimental data without several iteration cycles to fine-tune the model. Contrary to what one might believe, theoretical modelling of SFM experiments is therefore no black box, at least not at the present stage. A general approach for real understanding in SFM simulations must include the following components:

  • Justification for the interaction simulation method itself: empirical potentials can be useful, but must be carefully tested, and are usually inflexible.

  • An attempt to model the real experimental tip if enough data exists, or at least several plausible models must be considered.

  • For high-resolution imaging, tip and surface relaxations must be included since they have a significant influence on the interactions.

  • The dynamics of the cantilever and experimental electronics must be treated at a level appropriate for the phenomenon being simulated.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. M. Guggisberg, M. Bammerlin, Ch. Loppacher, O. Pfeiffer, A. Abdurixit, V. Barwich, R. Bennewitz, A. Baratoff, E. Meyer, and H.-J. Güntherodt. Phys. Rev. B, 61:11151, 2000.

    Article  CAS  Google Scholar 

  2. A. S. Foster, L. N. Kantorovich, and A. L. Shluger. Appl. Phys. A, 72:S59, 2000.

    Google Scholar 

  3. C. Barth, A. S. Foster, M. Reichling, and A. L. Shluger. Contrast formation in atomic resolution scanning force microscopy on CaF2 (111): Experiment and theory. J. Phys.: Condens. Matter, 13:2061, 2001.

    Article  CAS  Google Scholar 

  4. R. H. French, R. M. Cannon, L. K. DeNoyer, and Y. M. Chiang. Solid State Ionics, 75:13, 1995.

    Article  CAS  Google Scholar 

  5. A. I. Livshits and A. L. Shluger. Role of tip contamination in scanning force microscopy imaging of ionic surfaces. Faraday Discuss., 106:425, 1997.

    Article  CAS  Google Scholar 

  6. A. I. Livshits, A. L. Shluger, A. L. Rohl, and A. S. Foster. Phys. Rev. B, 59:2436, 1999.

    Article  CAS  Google Scholar 

  7. A. S. Foster, A. L. Rohl, and A. L. Shluger. Appl. Phys. A, 72:S31, 2000.

    Google Scholar 

  8. K. I. Fukui, H. Onishi, and Y. Iwasawa. Phys. Rev. Lett., 79:4202–4205, 1997.

    Article  CAS  Google Scholar 

  9. F. J. Giessibl, S. Hembacher, H. Bielefeldt, and J. Mannhart. Science, 289:422, 2000.

    Article  CAS  Google Scholar 

  10. R. Erlandsson, L. Olsson, and P. Mártensson. Phys. Rev. B, 54:R8309, 1996.

    Article  CAS  Google Scholar 

  11. H. Hosoi, K. Sueoka, K. Hayakawa, and K. Mukasa. Appl. Surf. Sci., 157, 2000.

    Google Scholar 

  12. W. Allers, S. Langkat, and R. Wiesendanger. Appl. Phys. A, 72:S27, 2001.

    Article  Google Scholar 

  13. A. I. Livshits and A. L. Shluger. Phys. Rev. B, 56:12482, 1997.

    Article  CAS  Google Scholar 

  14. R. Pérez, I. Stich, M. C. Payne, and K. Terakura. Phys. Rev. B, 58:10835, 1998.

    Article  Google Scholar 

  15. S. H. Ke, T. Uda, R. Pérez, I. Stich, and K. Terakura. First-principles investigation of tip-surface interaction on a GaAs(110) surface: Implications for atomic force and scanning tunneling microscopies. Phys. Rev. B, 60:11631, 1999.

    Article  CAS  Google Scholar 

  16. A. L. Shluger, A. I. Livshits, A. S. Foster, and C. R. A. Catlow. J. Phys.: Condens. Matter, 11:R295, 1999.

    Article  CAS  Google Scholar 

  17. A. L. Shluger and A. L. Rohl. Topics in Catalysis, 3:221, 1996.

    Article  CAS  Google Scholar 

  18. R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer, and A. L. Shluger. Phys. Rev. B, 62:2074, 2000.

    Article  CAS  Google Scholar 

  19. R. Pérez, M. C. Payne, I. Stich, and K. Terakura. Phys. Rev. Lett., 78:678, 1997.

    Article  Google Scholar 

  20. J. Tóbik, I. Stich, R. Pérez, and K. Terakura. Simulation of tip-surface interactions in atomic force microscopy of an InP(110) surface with a si tip. Phys. Rev. B, 60:11639, 1999.

    Article  Google Scholar 

  21. J. Tóbik, I. Stich, and K. Terakura. Phys. Rev. B, 63:245324, 2001.

    Article  CAS  Google Scholar 

  22. S. H. Ke, T. Uda, I. Stich, and K. Terakura. Phys. Rev. B, 63:245323, 2001.

    Article  CAS  Google Scholar 

  23. A. S. Foster, A. Y Gal, J. M. Airaksinen, O. H. Pakarinen, Y. J. Lee, J. D. Gale, A. L. Shluger, and R. M. Nieminen. Phys Rev. B, 68:195420, 2003.

    Article  CAS  Google Scholar 

  24. A. S. Foster, A. Y. Gal, J. D. Gale, Y. J. Lee, R. M. Nieminen, and A. L. Shluger. Phys. Rev. Lett., 92:036101, 2004.

    Article  CAS  Google Scholar 

  25. S. H. Ke, T. Uda, and K. Terakura. Phys. Rev. B, 65:125417, 2002.

    Article  CAS  Google Scholar 

  26. A. S. Foster, O. H. Pakarinen, J. M. Airaksinen, J. D. Gale, and R. M. Nieminen. Phys. Rev. B, 68:195410, 2003.

    Article  CAS  Google Scholar 

  27. T. Eguchi and Y. Hasegawa. Phys. Rev. Lett., 89:266105, 2002.

    Article  CAS  Google Scholar 

  28. A. Y. Gal and A. L. Shluger. Nanotec., 15:S108, 2004.

    Article  CAS  Google Scholar 

  29. P. V. Sushko, A. S. Foster, L. N. Kantorovich, and A. L. Shluger. Appl. Surf. Sci., 144–145:608, 1999.

    Article  Google Scholar 

  30. R. Oja and A. S. Foster. Nanotechnology, 16:S7, 2005.

    Article  CAS  Google Scholar 

  31. A. L. Shluger, L. N. Kantorovich, A. I. Livshits, and M. J. Gillan. Phys. Rev. B, 56:15332, 1997.

    Article  CAS  Google Scholar 

  32. T. Trevethan and L. Kantorovich. Nanotechnology, 16:S79, 2005.

    Article  CAS  Google Scholar 

  33. H. Hölscher, U. D. Schwarz, and R. Weisendanger. Appl. Surf. Sci., 140:344, 1999.

    Article  Google Scholar 

  34. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar. J. Appl. Phys., 69:668, 1991.

    Article  Google Scholar 

  35. F. J. Giessibl. Phys. Rev. B, 56:16010, 1997.

    Article  CAS  Google Scholar 

  36. F. J. Giessibl. Rev. Mod. Phys., 75:949, 2003.

    Article  CAS  Google Scholar 

  37. F. J. Giessibl, H. Bielefeldt, S. Hembacher, and J. Mannhart. Ann. Phys. (Liepzig), 10:887, 2001.

    Article  CAS  Google Scholar 

  38. R. García and R. Pérez. Surf. Sci. Rep., 47:197, 2002.

    Article  Google Scholar 

  39. U. Dürig. Interaction sensing in dynamic force microscopy. New J. Phys., 2, 2000.

    Google Scholar 

  40. M. Gauthier, N. Sasaki, and M. Tsukada. Phys. Rev. B, 64:085409, 2001.

    Article  CAS  Google Scholar 

  41. G. Couturier, R. Boisgard, L. Nony, and J. P. Aimé. Rev. Sci. Instr., 74:2726, 2003.

    Article  CAS  Google Scholar 

  42. M. Gauthier, R. Perez, T. Arai, M. Tomitori, and M. Tsukada. Phys. Rev. Lett., 89:146104, 2002.

    Article  CAS  Google Scholar 

  43. J. E. Sader and S. P. Jarvis. Phys. Rev. B, 70:012303, 2004.

    Article  CAS  Google Scholar 

  44. S. Hembacher, F. J. Giessibl, and J. Mannhart. Science, 305:380, 2004.

    Article  CAS  Google Scholar 

  45. R. Lüthi, E. Meyer, M. Bammerlin, A. Baratoff, L. Howard, C. Gerber, and H.-J. Güntherodt. Atomic resolution in dynamic force microscopy across steps. Surf. Rev. Lett., 4:1025, 1997.

    Article  Google Scholar 

  46. M. Gauthier and M. Tsukada. Theory of noncontact dissipation force microscopy. Phys. Rev. B, 60:11716, 1999.

    Article  CAS  Google Scholar 

  47. S. P. Jarvis, H. Yamada, K. Kobayashi, A. Toda, and H. Tokumoto. Appl. Surf. Sci., 157:314, 2000.

    Article  CAS  Google Scholar 

  48. S. Morita, R. Wiesendanger, and E. Meyer, editors. Noncontact Atomic Force Microscopy, chapter 20, page 395. Springer, Berlin, 2002.

    Google Scholar 

  49. S. Morita, R. Wiesendanger, and E. Meyer, editors. Noncontact Atomic Force Microscopy. Springer, Berlin, 2002.

    Google Scholar 

  50. N. Sasaki and M. Tsukada. Appl. Surf. Sci., 140:339, 1999.

    Article  CAS  Google Scholar 

  51. A. Abdurixit, T. Bonner, A. Baratoff, and E. Meyer. Appl. Surf. Sci., 157:355, 2000.

    Article  CAS  Google Scholar 

  52. L. N. Kantorovich. Phys. Rev. Lett., 89:096105, 2002.

    Article  CAS  Google Scholar 

  53. T. Trevethan and L. Kantorovich. Nanotechnology, 15:S34, 2004.

    Article  CAS  Google Scholar 

  54. T. Trevethan and L. Kantorovich. Nanotechnology, 15:S44, 2004.

    Article  CAS  Google Scholar 

  55. T. Trevethan and L. Kantorovich. Phys. Rev. B, 70:115411, 2004.

    Article  CAS  Google Scholar 

  56. L. N. Kantorovich and T. Trevethan. Phys. Rev. Lett, 93:236102, 2004.

    Article  CAS  Google Scholar 

  57. L. Bergström. Adv. Coll. Int. Sci., 70:125, 1997.

    Article  Google Scholar 

  58. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Appl. Phys. A, 72:S35, 2001.

    Google Scholar 

  59. P. Markiewicz and M. C. Goh. Langmuir, 10:5, 1994.

    Article  CAS  Google Scholar 

  60. C. Barth and C. R. Henry. Nanotechnology, 15:1264, 2004.

    Article  CAS  Google Scholar 

  61. S. Giorgio, C. Chapon, C. R. Henry, G. Nihoul, and J. M. Penisson. Phil. Mag. A, 64:87, 1991.

    CAS  Google Scholar 

  62. L. M. Molina and B. Hammer. Phys. Rev. Lett., 90:206102, 2003.

    Article  CAS  Google Scholar 

  63. K. Cooper, A. Gupta, and S. Beaudoin. J. Coll. Int. Sci., 234:284, 2001.

    Article  CAS  Google Scholar 

Download references

Rights and permissions

Reprints and permissions

Copyright information

© 2006 Springer Science+Business Media, LLC

About this chapter

Cite this chapter

(2006). Bringing Theory to Experiment in SFM. In: Scanning Probe Microscopy. NanoScience and Technology. Springer, New York, NY . https://doi.org/10.1007/0-387-37231-8_6

Download citation

Publish with us

Policies and ethics