Stuck-At-Fault Testability of SPP Three-Level Logic Forms

  • Valentina Ciriani
  • Anna Bernasconi
  • Rolf Drechsler
Part of the IFIP International Federation for Information Processing book series (IFIPAICT, volume 200)

Abstract

Recently introduced, three-level logic Sum of Pseudoproducts (SPP) forms allow the representation of Boolean functions with much shorter expressions than standard two-level Sum of Products (SOP) forms, or other three-level logic forms. In this paper the testability of circuits derived from SPPs is analyzed. We study testability under the Stuck-At Fault Model (SAFM). For SPP networks several minimal forms can be considered. While full testability can be proved for some classes, others are shown to contain redundancies. Experimental results are given to demonstrate the efficiency of the approach.

Keywords

Reliability and Testing Testability Design for Testability SPP Three-Level Network 

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Copyright information

© International Federation for Information Processing 2006

Authors and Affiliations

  • Valentina Ciriani
    • 1
  • Anna Bernasconi
    • 2
  • Rolf Drechsler
    • 3
  1. 1.Dip. di Tecnologie dell’InformazioneUniversita’ degli Studi di MilanoCremaItaly
  2. 2.Department of Computer ScienceUniversity of PisaPisaItaly
  3. 3.Institute of Computer ScienceUniversity of BremenBremenGermany

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