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Evaluation Methodology for Single Electron Encoded Threshold Logic Gates

  • Casper Lageweg
  • Sorin Cotofana
  • Stamatis Vassiliadis
Part of the IFIP International Federation for Information Processing book series (IFIPAICT, volume 200)

Abstract

Single Electron Tunneling (SET) is an emerging technology, with a switching behavior which is completely different from MOS technology. The ability to control the transport of individual electrons within SET circuits creates the conditions for Single Electron Encoded Logic (SEEL). Although it is expected that, when compared with other approaches, SEEL circuits have both reduced delay and reduced energy consumptions, a method for evaluation is required. This paper proposes a methodology to evaluate delay, power consumption, maximum fanin, and maximum fanout for buffered SEEL linear threshold gates. Furthermore, we discuss the implications of the proposed methodology on practical networks of such gates. We estimate that buffered threshold gates operating at room temperature can potentially switch with a delay of 6 ps and have a packing density of 109 gates per cm 2.

Keywords

SET single electron technology single electron encoded logic threshold gates 

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Copyright information

© International Federation for Information Processing 2006

Authors and Affiliations

  • Casper Lageweg
    • 1
  • Sorin Cotofana
    • 1
  • Stamatis Vassiliadis
    • 1
  1. 1.Computer Engineering Laboratory Faculty of Electrical Engineering, Mathematics and Computer ScienceDelft University of TechnologyDelftThe Netherlands

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