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RF Testing

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Book cover Gizopoulos / Advances in ElectronicTesting

Part of the book series: Frontiers in Electronic Testing ((FRET,volume 27))

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References

  1. International Technology Roadmap for Semiconductors 2003: Executive Summary.

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  2. J. Ferrario, R. Wolf, H. Ding and M. Slamani “Moving from Mixed Signal to RF Test Hardware Development”, Proceedings International Test Conference, 2001.

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  3. J. Pineda de Gyvez, R Amine and G Gronthoud “VDD Ramp Testing for RF Circuits”, Proceedings International Test Conference, 2003, pp. 651-658.

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  4. S. Bhattacharya, A. Halder and A. Chatterjee, “Automatic Multitone Alternate Test Generation for RF Circuits Using Behavioral Model”, Proceedings International Test Conference, 2003, pp. 659-664.

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  5. J. Ferrario, R. Wolf, S. Moss, andM. Slamani “A Low-Cost Test Solution for Wireless Phone RFICs”, IEEE Communications Magazine, Sept 2003, Vol. 41 No 9, pp. 82-88.

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  6. D. Brown, J. Ferrario, R. Wolf and J. Li, “RF Testing on a Mixed Signal Tester”, Proceedings International Test Conference, 2004.

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  7. M. Slamani, J. Bhagat, J. Ferrario, and R. Wolf, “Challenges of incorporating an RF test system on a board”, 3rd Workshop on Test of Wireless Circuits and Systems, 2004.

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  8. J. Ferrario, R. Wolf and S. Moss, “Architecting Millisecond Test Solutions for Wireless Phone RF ICs”, Proceedings International Test Conference, Washington D. C., Oct. 2002.

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Author information

Authors and Affiliations

  1. RF and Analog Test Group, IBM, Essex Junction, VT, USA

    Randy Wolf

  2. RF and Analog Test Group, IBM, Essex Junction, VT, USA

    Mustapha Slamani

  3. RF and Analog Test Group, IBM, Essex Junction, VT, USA

    John Ferrario

  4. RF and Analog Test Group, IBM, Essex Junction, VT, USA

    Jayendra Bhagat

Authors
  1. Randy Wolf
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  2. Mustapha Slamani
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  3. John Ferrario
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  4. Jayendra Bhagat
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Editor information

Editors and Affiliations

  1. University of Piraeus, Greece

    Dimitris Gizopoulos

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© 2006 Springer

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Wolf, R., Slamani, M., Ferrario, J., Bhagat, J. (2006). RF Testing. In: Gizopoulos, D. (eds) Gizopoulos / Advances in ElectronicTesting. Frontiers in Electronic Testing, vol 27. Springer, Boston, MA. https://doi.org/10.1007/0-387-29409-0_10

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  • DOI: https://doi.org/10.1007/0-387-29409-0_10

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-29408-7

  • Online ISBN: 978-0-387-29409-4

  • eBook Packages: EngineeringEngineering (R0)

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