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© 2006 Springer Science+Business Media, Inc.
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(2006). Noise Analysis and Design in Deep Submicron. In: Interconnect Noise Optimization in Nanometer Technologies. Springer, Boston, MA. https://doi.org/10.1007/0-387-29366-3_2
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DOI: https://doi.org/10.1007/0-387-29366-3_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-25870-6
Online ISBN: 978-0-387-29366-0
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