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Bulk CMOS photodiodes for λ = 400 nm

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Part of the book series: The International Series in Engineering and Computer Science ((SECS,volume 869))

Abstract

The photodiode bandwidth is a strong function of the wavelength. The previous two chapters assumed λ=850 nm. This chapter presents both time domain and frequency domain analyses of monosilicon photodiodes in a standard 0.18 µm CMOS technology, for λ = 400 nm.

For monosilicon diodes, the maximum calculated intrinsic −3 dB bandwidth is up to 6 GHz at λ = 400 nm; this corresponds to a cut-off frequency of about 4 GHz. The photodiodes designed in twin-well technology have smaller bandwidth because of the limited size of the vertical depletion region. Measurements on p+/nwell/p-substrate photodiode designed in 0.18 µm CMOS, showed that the total diode bandwidth is 1.7 GHz, which was limited by the electrical diode bandwidth in our measurements.

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Bibliography

  1. Wei Jean Liu, Oscal T.-C. Chen, Li-Kuo Dai and Far-Wen Jih Chung Cheng: “A CMOS Photodiode Model”, 2001 IEEE International Workshop on Behavioral Modeling and Simulation, Santa Rosa, California, October 10–12, 2001.

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© 2006 Springer

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(2006). Bulk CMOS photodiodes for λ = 400 nm. In: High-Speed Photodiodes in Standard CMOS Technology. The International Series in Engineering and Computer Science, vol 869. Springer, Boston, MA . https://doi.org/10.1007/0-387-28592-X_5

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  • DOI: https://doi.org/10.1007/0-387-28592-X_5

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-28591-7

  • Online ISBN: 978-0-387-28592-4

  • eBook Packages: EngineeringEngineering (R0)

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