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Usami, K., Sakurai, T. (2006). Methodologies for Power Gating. In: Leakage in Nanometer CMOS Technologies. Series on Integrated Circuits and Systems. Springer, Boston, MA. https://doi.org/10.1007/0-387-28133-9_4
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DOI: https://doi.org/10.1007/0-387-28133-9_4
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