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Statistics of Field Electron Emission

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Book cover Field Emission in Vacuum Microelectronics

Part of the book series: Microdevices ((MDPF))

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Abstract

Several fundamental physical processes involved in field electron emission can be elucidated through measurements of the statistical distribution of “elementary emission events,” that is, the statistical distribution of the emission of either a single electron or group of correlated electrons. In the general case, with some probability Pi, one may observe some number Ni of electrons for a given emission event. The function P(N), is the distribution of N over different events.

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© 2005 Kluwer Academic / Plenum Publishers, New York

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(2005). Statistics of Field Electron Emission. In: Brodie, I., Schwoebel, P. (eds) Field Emission in Vacuum Microelectronics. Microdevices. Springer, Boston, MA. https://doi.org/10.1007/0-387-27419-7_6

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