Abstract
Relative compactness and tightness; uniform topology on C(K,S); Skorohod’s J1-topology; equicontinuity and tightness; convergence of random measures; superposition and thinning; exchangeable sequences and processes; simple point processes and random closed sets
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© 1997 Applied Probability Trust
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(1997). Convergence of Random Processes, Measures, and Sets. In: Foundations of Modern Probability. Probability and its Applications. Springer, New York, NY. https://doi.org/10.1007/0-387-22704-0_14
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DOI: https://doi.org/10.1007/0-387-22704-0_14
Publisher Name: Springer, New York, NY
Print ISBN: 978-0-387-94957-4
Online ISBN: 978-0-387-22704-7
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