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References
J. Gale, J. Tirso, C. Burchfiled, “Implementing the defect prevention process in the MVS interactive programming organization”, IBM Systems Journal, Vol. 29,No. 1, 1990.
W. Humphrey, A Discipline for Software Engineering, Addison-Wesley, Reading, MA, 1995.
G. Myers, The Art of Software Testing, John Wiley, New York, 1979.
M. Abramovici, M. Brever, A. Friedman, Digital System Testing and Testable Design, Computer Science Press, New York, 1990.
B. Wilkins, Principles of Testing in VSLI Circuits and Systems in Silicon, A. Brown, ed., McGraw-Hill, New York, 1991, pp. 222–250.
B. Beizer, Software Testing Techniques, second edition, Van Nostrand Reinhold, New York, 1990.
IEEE Standard Classification for Software Anomalies (IEEE Std. 1044–1993), copyright 1994 by IEEE, all rights reserved.
R. Grady, Practical Software Metrics for Project Management and Process Improvement, Prentice Hall, Englewoood Cliffs, NJ, 1992.
C. Kaner, J. Falk, H. Nguyen, Testing Computer Software, second edition, Van Nostrand Reinhold, New York, 1993.
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(2003). Defects, Hypotheses, And tests. In: Practical Software Testing. Springer Professional Computing. Springer, New York, NY. https://doi.org/10.1007/0-387-21658-8_3
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DOI: https://doi.org/10.1007/0-387-21658-8_3
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