Abstract
Reflection of electromagnetic waves from layered structures under different polarization conditions is studied. The main medium electrodynamic characteristic property taken into account is the electric permittivity. The analysis is performed using either a deterministic or a probabilistic (stochastic) approach. Various permittivity profiles are chosen: linear, exponential and polynomial. In the case that the permittivity has a random fluctuating part, a stochastic approach leading to an integral equation is used to determine the ensemble-averaged reflection coefficient and the average power.
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© 2004 Kluwer Academic Publishers
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(2004). Reflection of Electromagnetic Waves from Non-Uniform Layered Structures. In: Mathematical and Physical Modelling of Microwave Scattering and Polarimetric Remote Sensing. Remote Sensing and Digital Image Processing, vol 3. Springer, Dordrecht. https://doi.org/10.1007/0-306-48091-3_11
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DOI: https://doi.org/10.1007/0-306-48091-3_11
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-0122-2
Online ISBN: 978-0-306-48091-1
eBook Packages: Springer Book Archive