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© 2002 Kluwer Academic Publishers
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(2002). Scan-Based BIST. In: A Designer’s Guide to Built-In Self-Test. Frontiers in Electronic Testing, vol 19. Springer, Boston, MA. https://doi.org/10.1007/0-306-47504-9_10
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DOI: https://doi.org/10.1007/0-306-47504-9_10
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4020-7050-1
Online ISBN: 978-0-306-47504-7
eBook Packages: Springer Book Archive