Summary
Using the double focus technique sound velocity and thickness of thin samples can be determined directly and simultaneously. As a result no sample preparation is required, it is not necessary to attach the samples to a substrate in order to receive a reference signal. Currently, the model is being refined aiming at technical applications.
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References
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© 2002 Kluwer Academic Publishers
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Hänel, V., Kleffner, B. (2002). Double Focus Technique for Simultaneous Measurement of Sound Velocity and Thickness of Thin Samples Using Time-Resolved Acoustic Microscopy. In: Lee, H. (eds) Acoustical Imaging. Acoustical Imaging, vol 24. Springer, Boston, MA. https://doi.org/10.1007/0-306-47108-6_27
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DOI: https://doi.org/10.1007/0-306-47108-6_27
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-46518-5
Online ISBN: 978-0-306-47108-7
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