Abstract
The Coordinate Measuring Machines (CMMs) are widely used for the three-dimensional measurements of workpieces. For solving the limits and the drawbacks of the traditional CMMs, we have started developing nano-CMM that measures three dimensional parts in nanometer resolution. In this article, we evaluate the repeatability and the straightness of stages of nano-CMM.
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References
K. Takamasu, S. Ozawa, T. Asano, A. Suzuki, R. Furutani and S. Qzono, Basic Concepts of Nano CMM(Coordinate Measuring Machine with Nanometer Resolution), Jpn.-China Bilateral Symp. on Advanced Manufacturing Eng., 1996, 155
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© 2002 Kluwer Academic Publishers
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Fujiwara, M., Yamaguchi, A., Takamasu, K., Ozono, S. (2002). Evaluation of Stages of Nano-CMM. In: Inasaki, I. (eds) Initiatives of Precision Engineering at the Beginning of a Millennium. Springer, Boston, MA. https://doi.org/10.1007/0-306-47000-4_124
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DOI: https://doi.org/10.1007/0-306-47000-4_124
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-7923-7414-5
Online ISBN: 978-0-306-47000-4
eBook Packages: Springer Book Archive