Skip to main content

Generalized Phase-shifting Method for Measuring Photoelastic Fringe Parameters and its Applications

  • Conference paper
IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics

Part of the book series: Solid Mechanics and its Applications ((SMIA,volume 82))

  • 906 Accesses

Abstract

A generalized phase-shifting method was developed for reducing the influence of noise caused by the variation in light intensity of a light source and so on, and for automatically measuring photoelastic parameters, relative fringe orders and principal-stress directions, in the whole field. The fringe orders obtained using the method were used to measure the stress intensity factor, and the principal-stress directions to extract the zero points. Furthermore the zero points were used to design structural members with holes. The stress intensity factor in a beam with a crack on one side subjected to a three-point bending was accurately obtained from fringe loops multiplied using a technique for drawing a contour map of the fringe order values. The zero points in a T-shaped plate subjected to a compressive load were accurately extracted using a technique for judging the zero points, and were effective to design the plate with holes.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 259.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 329.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 329.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Umezaki, E., Tamaki, E., Shimamoto, A., and Takahashi, S.,: Whole-field measurement of principal stress directions from photoelastic experiment using image processing system in T.H. Hyde and E. Ollerton (eds.), Applied Stress Analysis, Elsevier Applied Science Publishers, London, 1990, pp.526–535.

    Google Scholar 

  2. Patterson, E.A., and Wang, Z.F.: Towards full field automated photoelastic analysis of complex components, Strain, 27-2 (1991), 49–56.

    Article  Google Scholar 

  3. Haake, S. J., and Patterson, E.A.: Photoelastic analysis of frozen stressed specimens using spectral-contents Analysis, Experimental Mechanics, 32-3(1992), 266–272.

    Article  Google Scholar 

  4. Morimoto, Y., Morimoto, Y. Jr, and Hayashi, T.: Separation of isochromatics and isoclinics using Fourier transform, Experimental Technics, 18-5(1994), 13–17.

    Article  Google Scholar 

  5. Ajovalasit, A., Barone, S., and Petrucci, G.: Toward RGB photoelasticity: full field automated photoelasticity in white light, Experimental Mechanics, 35-3(1995) 29–34.

    Article  Google Scholar 

  6. Umezaki, E., Watanabe, H., and Shimamoto, A.: Automatic whole-field measurement of photoelastic fringe orders using generalized phase-shift method, Post Conf. Proc. VIII Int. Cong. On Experimental Mechanics, Nashville, 1996, pp. 154–159.

    Google Scholar 

  7. Gotoh, J., Yoneyama S., Mawatari, S., and Takashi, M.: Photoelastic analysis from a single piece of image with linearly polarized RGB lights, Post Conf. Proc. VIII Int. Cong. On Experimental Mechanics, Nashville, 1996, pp. 160–166.

    Google Scholar 

  8. Ramesh, K., and Deshmukh, S.S.: Automation of white light photoelasticity by phase-shifting technique using colour image processing hardware, Optics and Lasers in Engineering, 28-1(1997),.47–60.

    Article  ADS  Google Scholar 

  9. Hoy, D.E.P.: On the use of color imaging in experimental applications, Experimental Techniques, 21-4(1997), 17–19.

    Article  MathSciNet  Google Scholar 

  10. Umezaki, E., and Kawakami, T.: Measurement of principal-stress directions from photoelastic experiment using generalized phase-shift method, Optical Review, 4-2(1997), 249–252.

    Article  ADS  Google Scholar 

  11. Umezaki, E., Koike, H., Shimamoto, A., and Watanabe, H.: Accuracy of measurement of photoelastic fringe orders and principal-stress directions using phase-shift method, J. Japan Society for Non-Destructive Inspection (in Japanese), 45-1(1996), 61–67.

    Google Scholar 

  12. Takahashi, S., and Nogata, F.: Application of photoelastic method to mechanical engineering (1), Science of Machine (in Japanese), 38-1(1986), 82–86.

    Google Scholar 

  13. Okamura, H.: Introduction to linear fracture mechanics (in Japanese), Baihukan, Tokyo, 1976, pp.218–219.

    Google Scholar 

  14. Umezaki, E., Watanabe, H., Sirichai, S., and Shimamoto, A.: Extraction of singular points from photoelastic experiment, in J.F.S. Gomes et al. (eds.) Recent Advances in Experimental Mechanics, A.A. Balkema, Rotterdam, 1994, pp. 107–112.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2000 Kluwer Academic Publishers

About this paper

Cite this paper

Umezaki, E., Nanka, Y. (2000). Generalized Phase-shifting Method for Measuring Photoelastic Fringe Parameters and its Applications. In: Lagarde, A. (eds) IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics. Solid Mechanics and its Applications, vol 82. Springer, Dordrecht. https://doi.org/10.1007/0-306-46948-0_3

Download citation

  • DOI: https://doi.org/10.1007/0-306-46948-0_3

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-6604-1

  • Online ISBN: 978-0-306-46948-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics