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Load balancing in parallel circuit testing with annealing-based and genetic algorithms

  • C. Gil
  • J. Ortega
  • A. F. Díaz
  • M. G. Montoya
  • A. Prieto
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1498)

Abstract

A new combination of Simulated Annealing and Tabu Search is presented for load balancing in a parallel circuit testing procedure. The testing procedure requires a circuit partitioning algorithm to distribute the workload among the processors in such a way that similar sized parts of the circuit are assigned to each processor while communications are minimised. The hybrid algorithm for circuit partitioning is compared with pure tabu search and simulated annealing algorithms, and also with a genetic algorithm. The solutions obtained are evaluated for the circuits of a frequently used benchmark set.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • C. Gil
    • 1
  • J. Ortega
    • 2
  • A. F. Díaz
    • 2
  • M. G. Montoya
    • 1
  • A. Prieto
    • 2
  1. 1.Dept. de Arquitectura de Computadores y ElectrónicaUniv. AlmeríaSpain
  2. 2.Dept. de Arquitectura y Tecnología de ComputadoresUniv. GranadaSpain

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