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A Correlated Study of Nanotube/Nanowire Transistor Between TEM Inspection and Electrical Characterization

  • Yann-Wen LanEmail author
  • Po-Chun Chen
Chapter
Part of the Nanostructure Science and Technology book series (NST)

Abstract

In this chapter, we introduce a novel method for a correlated study of nanowire/nanotube based on electrical measurements and electron microscope imaging. Two kinds of chip platforms are used, which named as the through-hole chip and the membrane chip, respectively. These kinds of chip platforms allow a physical correlation to be established for transmission electron microscopy inspection and electrical characterization. In order to demonstrate the correlated study, we conduct a few nanomaterials, including carbon nanotube, nanowire, and graphene derivatives, which are placed on top of the specific chips by manipulators. The results strongly indicate that the electrical property in the quasi-one-dimensional nanomaterials is sensitive to their structure such defect, contamination, and adsorption from environment.

Keywords

Nanowire Carbon nanotube Transmission electron microscopy Graphene Nanomaterials 

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Copyright information

© Springer Nature Singapore Pte Ltd. 2019

Authors and Affiliations

  1. 1.Department of PhysicsNational Taiwan Normal UniversityTaipeiTaiwan

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