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Electronics Design for the QE Uniformity Test System

  • Yichao Ma
  • Xinyang Hong
  • Sen Qian
  • Yafan Tao
  • Yongsheng Shi
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 213)

Abstract

Because of the photocathode has direct influence on the performance of the PMTs, it is important to test the uniformity of the photocathode in the PMTs. In this manuscript, a photocathode uniformity scanning test system of 20 in. large PMTs was designed. This platform used multiple light sources system to test the photocathode uniformity quickly and efficiency. The consistency of the light source in test system is very good. After long time continuous test, the uniformity of light source in this system is less than 3% and the drift less than 0.8% in 1 h, 1.5% in 4 h and 2% in 10 h.

Keywords

Electronics design FPGA Uniformity 

Notes

Acknowledgements

The MCP-PMT development project has been partially supported by the Strategic Priority Research Program of the Chinese Academy of Sciences (Grant No. XDA10010400) and the National Natural Science Foundation of China (Grant Nos. 11175198, 11475209, 11675205 and 11675196).

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Copyright information

© Springer Nature Singapore Pte Ltd.  2018

Authors and Affiliations

  • Yichao Ma
    • 1
  • Xinyang Hong
    • 1
  • Sen Qian
    • 2
    • 3
  • Yafan Tao
    • 1
  • Yongsheng Shi
    • 1
  1. 1.Shaanxi University of Science and TechnologyXi’anChina
  2. 2.Institute of High Energy PhysicsChinese Academy of SciencesBeijingChina
  3. 3.State Key Laboratory of Particle Detection and ElectronicsBeijingChina

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