Application of the SOPHIAS Detector to Synchrotron Radiation X-Ray Experiments
Application of synchrotron radiation science to structural analysis for functional materials is attracting considerable interest. When a low-emittance synchrotron ring is used, higher performance is required from an X-ray area detector used in experiments. The charge-integrating-type detector SOPHIAS, which was designed for the SACLA free-electron laser experiments, was developed by RIKEN using silicon-on-insulator technology. The SOPHIAS detector has a 2157 × 891 pixel array consisting of 30 μm square pixels. SOPHIAS is a powerful tool for X-ray structural analysis because of its high definition and high dynamic range. The application of SOPHIAS to synchrotron radiation experiments has begun at the Photon Factory, KEK (KEK/PF). Focusing on small angle X-ray scattering (SAXS) measurements of block copolymers, synchrotron radiation X-ray experiments were conducted using SOPHIAS at KEK/PF. The SAXS pattern of a sample, polybutadiene-poly(ε-caprolactone) diblock copolymer/polybutadiene blend, has complicated peaks structure originating in Frank–Kasper σ phase; thus, the fine pixel array of SOPHIAS was very important for resolving the peaks. We report the results of experiments using SOPHIAS.
KeywordsPhoton detector Semiconductor detector
The experiments were executed under the approval of the Photon Factory Advisory Committee (Proposal No. 2015G092). This study was supported by JSPS KAKENHI Grant Number 25109007 and 25109008.