Advertisement

Study of Radiation-Induced Soft-Errors in FPGAs for Applications at High-Luminosity \(e^+e^-\) Colliders

  • Raffaele Giordano
  • Gennaro Tortone
  • Alberto Aloisio
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 212)

Abstract

At the KEK laboratory (Tsukuba, Japan), the SuperKEKB \(e^{+}e^{-}\) collider has been commissioned in February 2016 and it has been operated until June 2016 completing the so-called Phase-1.

In this work, we present measurements of configuration soft-errors induced by radiation in a SRAM-based FPGA device installed within 1 m from one of the SuperKEKB beam pipes. During the SuperKEKB operation, we continuously read back the FPGA configuration memory in order to spot upsets and we logged power consumption at the different power rails of the device in order to search for total dose effects. Since the operation current of the SuperKEKB collider spanned a range between 50 and 500 mA for both the electron and positron rings, the experimental scenario allowed us to perform measurements in different radiation conditions.

Keywords

FPGA Upset Radiation Collider Accesso Aperto MIUR 

Notes

Acknowledgments

This work is part of the ROAL SIR project funded by the Italian Ministry of Research (MIUR), grant no. RBSI14JOUV. “Accesso Aperto MIUR". The institutions which contributed to the results reported in this work are listed below as affiliations of the authors. We also wish to thank all the members of the BEAST2 community for supporting this activity.

References

  1. 1.
    Xilinx Inc.: Virtex UltraScale FPGAs Data Sheet: DC and AC Switching Characteristics, DS893 (v1.7.1), 4 April 2016Google Scholar
  2. 2.
    Altera Corp.: Stratix 10 Device Overview, S10-OVERVIEW, 04 December 2015Google Scholar
  3. 3.
    Hiemstra, D.M., Kirischian, V.: Single event upset characterization of the kintex-7 field programmable gate array using proton irradiation. In: Proceedings of 2014 IEEE Radiation Effects Data Workshop (REDW), Paris (2014).  https://doi.org/10.1109/REDW.2014.7004593
  4. 4.
    Higuchi, T., Nakao, M., Nakano, E.: Radiation tolerance of readout electronics for Belle II. In: Proceedings of Topical Workshop on Electronics for Particle Physics, Vienna (2011)Google Scholar
  5. 5.
    Røed, K., Alme, J., Fehlker, D., Lippmann, C., Rehman, A.: First measurement of single event upsets in the readout control FPGA of the ALICE TPC detector. In: Proceedings of Topical Workshop on Electronics for Particle Physics, Vienna (2011)Google Scholar
  6. 6.
    Samaras, A., Varotsou, A., Chatry, N., Lorfevre, E., Bezerra, F., Ecoffet, R.: CARMEN1 and CARMEN2 experiment: comparison between in-flight measured SEE rates and predictions. In: Proceedings of the 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Moscow (2015).  https://doi.org/10.1109/RADECS.2015.7365590
  7. 7.
    Xilinx Inc.: Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated Circuits, WP286 (v2.0), 22 March 2016Google Scholar
  8. 8.
    Adachi, I.: Status of Belle II and SuperKEKB. JINST 64(6), 1185–1190 (2017)Google Scholar
  9. 9.
    Aloisio, A., Ameli, F., Anastasio, A., Branchini, P., Di Capua, F., Giordano, R., Izzo, V., Tortone, G.: uSOP: a microprocessor-based service oriented platform for control and monitoring. IEEE Trans. Nucl. Sci. PP(99) (2017).  https://doi.org/10.1088/1748-0221/9/07/C07017, C07017
  10. 10.
    GW-Instek: DC Power Supply, GPD-X303S Series, User Manual Gw-Instek part no. 82PD-433S0M01 (2014)Google Scholar
  11. 11.
    Linear Technology: 24-Bit 8-/16-Channel DS ADC with Easy Drive Input Current Cancellation and I2C Interface (2006)Google Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  • Raffaele Giordano
    • 1
    • 2
  • Gennaro Tortone
    • 2
  • Alberto Aloisio
    • 1
    • 2
  1. 1.University of Naples ‘Federico II’NaplesItaly
  2. 2.INFN Sezione di NapoliNaplesItaly

Personalised recommendations