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Electron Microscopy: Principle, Components, Optics and Specimen Processing

  • Pranab Dey
Chapter

Abstract

Electron microscope (EM) uses high-energy electron beam as probe instead of visible light. The electrons have shorter wavelength and provides very high-resolution capacity (0.1 nm) and 500,000 times magnification power. It is also easy to manipulate the electron beams. Instead of glass as lens, the electron microscope uses electromagnetic coil as condenser and objectives. This chapter covers the principle, essential components, microscope column and electronic optics of EM. The chapter also describes the specimen and electron interaction. In addition the collection, processing and staining for EM have also been described.

Keywords

Electron microscope Wehnelt cylinder Tungsten filament Turbomolecular pump Electronic optics Electron interaction Elastic scattering Non-elastic scattering Secondary electrons Backscattered electrons Transmission electron microscope Epoxy resin Acrylic media Semi-thin sections Ultrathin section Scanning electron microscope 

References

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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  • Pranab Dey
    • 1
  1. 1.Education and Research (PGIMER)Post Graduate Institute of Medical Education and Research (PGIMER)ChandigarhIndia

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