Electron Microscopy: Principle, Components, Optics and Specimen Processing

  • Pranab Dey


Electron microscope (EM) uses high-energy electron beam as probe instead of visible light. The electrons have shorter wavelength and provides very high-resolution capacity (0.1 nm) and 500,000 times magnification power. It is also easy to manipulate the electron beams. Instead of glass as lens, the electron microscope uses electromagnetic coil as condenser and objectives. This chapter covers the principle, essential components, microscope column and electronic optics of EM. The chapter also describes the specimen and electron interaction. In addition the collection, processing and staining for EM have also been described.


Electron microscope Wehnelt cylinder Tungsten filament Turbomolecular pump Electronic optics Electron interaction Elastic scattering Non-elastic scattering Secondary electrons Backscattered electrons Transmission electron microscope Epoxy resin Acrylic media Semi-thin sections Ultrathin section Scanning electron microscope 


  1. 1.
    Jensen EC. Types of imaging, part 1: electron microscopy. Anat Rec (Hoboken). 2012;295(5):716–21.CrossRefGoogle Scholar
  2. 2.
    Müller SA, Aebi U, Engel A. What transmission electron microscopes can visualize now and in the future. J Struct Biol. 2008;163(3):235–45.CrossRefPubMedGoogle Scholar
  3. 3.
    Haggis GH. Sample preparation for electron microscopy of internal cell structure. Microsc Res Tech. 1992;22(2):151–9.CrossRefPubMedGoogle Scholar
  4. 4.
    Carr KE, Toner PG, Saleh KM. Scanning electron microscopy. Histopathology. 1982 Jan;6(1):3–24.CrossRefPubMedGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  • Pranab Dey
    • 1
  1. 1.Education and Research (PGIMER)Post Graduate Institute of Medical Education and Research (PGIMER)ChandigarhIndia

Personalised recommendations