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Photon Emission from the Scanning Tunneling Microscope

  • Makoto SakuraiEmail author
Chapter

Abstract

Photon emission from a scanning tunneling microscope (STM) is based on photon creation due to inelastic scattering of electrons tunneling from a STM tip through the tunneling gap under the application of bias voltage.

Keywords

Photon Inelastic scattering Far-field Tunneling Radiative transition 

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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.WPI-Center for Materials Nanoarchitectonics (MANA)National Institute for Materials Science (NIMS)TsukubaJapan

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