Particle-Induced X-Ray Emission
PIXE was first proposed by Sven Johansson in 1970 . This method of analysis is based on the emission of characteristic X-rays from a sample after inner-shell ionization with ions from accelerators. In comparison to other analytical techniques based on X-ray spectrometry, such as EPMA and XRF, the ion beams generate fewer continuous X-rays, which dwarf the trace element peaks. Thus, it has an excellent sensitivity down to the ppm level for solids and the ppb level for liquids.
KeywordsPIXE Quantitative analysis Multipurpose Small quantity Non-destructive analysis
- 1.Johansson, S.A.E., Campbell, J.L.: PIXE: A novel technique for elemental analysis, pp. 1–347. John Wiley & Sons, Chichester, U. K. (1988)Google Scholar