Advertisement

Atomic Force Microscope

  • Shintaro FujiiEmail author
Chapter

Abstract

AFM was developed to overcome a drawback of scanning tunneling microscopy (STM), which can only image conducting surfaces.

Keywords

Surface topography Nonconducting surface Nano- or atomic-scale resolution Force spectroscopy 

References

  1. 1.
    Wolter, O., Bayer, Th, Greschner, J.: Micromachined silicon sensors for scanning force microscopy. J. Vac. Sci. Technol. B 9, 1353–1357 (1991)CrossRefGoogle Scholar
  2. 2.
    Giessibl, F.J., Binnig, G.: Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum. Ultramicroscopy 42–44, 281–289 (1992)CrossRefGoogle Scholar
  3. 3.
    Giessibl, F.J.: Advances in atomic force microscopy. Rev. Mod. Phys. 75, 949–983 (2003)CrossRefGoogle Scholar
  4. 4.
    Lee, G.U., Chrisey, L.A., Colton, R.J.: Direct measurement of the forces between complementary strands of DNA. Science 266, 771–773 (1994)CrossRefGoogle Scholar
  5. 5.
    Xu, B., Xiao, X., Tao, N.J.: J. Am. Chem. Soc. 125, 16164–16165 (2003)CrossRefGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Department of Chemistry, School of ScienceTokyo Institute of TechnologyTokyoJapan

Personalised recommendations