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Lateral Force Microscopy

  • Shiho MoriguchiEmail author
Chapter

Abstract

In lateral force microscopy, not only the topographic image of the sample surface but also the distribution image of the lateral force in the same area can be gotten simultaneously.

Keywords

Lateral force Friction force Dynamic friction coefficient Topography 

References

  1. 1.
    Ogletree, D.F., Carpick, R.W., Salmeran, M.: Calibration of frictional forces in atomic force microscopy. Rev. Sci. Instrum. 67, 3298 (1996)CrossRefGoogle Scholar
  2. 2.
    Matsumoto, N., Kobayashi, K.: Investigation of Relevance of the Environment in Friction Force Measurement. Kyoto University FY2003 Nanotechnology Support Project Report. 049 (2003)Google Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Shimadzu Techno-Research, INCKyotoJapan

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